Power gating circuit and power gating control system

ABSTRACT

A power gating circuit is provided. The power gating circuit includes a logic gate group. The power gating circuit also includes a first switching circuit coupled to first and second supply voltages and the logic gate group. The power gating circuit further includes a second switching circuit coupled to the first and second supply voltages and the logic gate group. The first and second supply voltages are supplied to the logic gate group through the first switching circuit based on a voltage select signal. The first and second supply voltages are supplied to the logic gate group through the second switching circuit based on the voltage select signal and a power down signal.

CROSS-REFERENCES TO RELATED APPLICATION

The present application claims priority under 35 U.S.C. § 119(a) toKorean application number 10-2018-0028566, filed on Mar. 12, 2018, inthe Korean Intellectual Property Office, which is incorporated herein byreference in its entirety.

BACKGROUND 1. Technical Field

Various embodiments generally relate to a semiconductor circuit, andmore particularly, to a power gating circuit and a power gating controlsystem.

2. Related Art

Recently, electronic devices, for example, portable electronic deviceshave been reduced in size and weight, but the number of function blocksmounted in the potable electronic devices has continuously increased.

In particular, since the portable electronic devices are operated by alimited power supply such as a battery, power which is unnecessarilyconsumed by the function blocks in a power down mode must be reduced.

For this operation, a power gating technique is applied to the portableelectronic devices, in order to prevent power the unnecessary powerconsumption of the function blocks in the power down mode.

Therefore, there is a demand for a power gating technique which canimprove the operation performance of an electronic device and isoptimized to current consumption reduction.

SUMMARY

In an embodiment, a power gating circuit may be provided. The powergating circuit may include a logic gate group. The power gating circuitmay include a first switching circuit coupled to first and second supplyvoltages and the logic gate group. The power gating circuit may includea second switching circuit coupled to the first and second supplyvoltages and the logic gate group. The first and second supply voltagesmay be supplied to the logic gate group through the first switchingcircuit based on a voltage select signal. The first and second supplyvoltages may be supplied to the logic gate group through the secondswitching circuit based on the voltage select signal and a power downsignal.

In an embodiment, a power gating control system may be provided. Thepower gating control system may include a logic circuit regionconfigured to operate according to a first or second supply voltage, andmay include internal logic gates of which threshold voltages are variedaccording to bulk bias voltages. The power gating control system mayinclude a mode register configured to store bulk bias voltages as codesignals for the first and second supply voltages, respectively, the bulkbias voltages being optimized for threshold voltage control at operationfrequencies. The power gating control system may include a commandcontrol circuit configured to determine an operation state of anelectronic device and a frequency of a clock signal according to acommand signal inputted from outside, and generate control signalsaccording to the operation state and the frequency. The power gatingcontrol system may include a voltage generation circuit configured togenerate a plurality of bulk bias voltages according to the codesignals. The power gating control system may include a power gatingcontrol circuit configured to provide the first or second supply voltageto the logic circuit region according to the control signals, select thebulk bias voltages suitable for the logic circuit region among theplurality of bulk bias voltages, and provide the selected bulk biasvoltages to the logic circuit region.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates the configuration of an electronic system inaccordance with an embodiment.

FIG. 2 illustrates the configuration of a power gating control system inaccordance with a present embodiment.

FIG. 3 illustrates the configuration of a mode register of FIG. 2.

FIG. 4 illustrates the configuration of a logic circuit region of FIG.2.

FIG. 5 illustrates the configuration of a power gating control system inaccordance with other embodiments.

FIG. 6 illustrates the configuration of a logic circuit region and abulk bias control circuit in FIG. 5.

DETAILED DESCRIPTION

Hereinafter, a power gating circuit and a control system thereofaccording to the present disclosure will be described below withreference to the accompanying drawings through examples of embodiments.

Various embodiments may be directed to a power gating circuit capable ofpreventing an operation performance reduction while reducing currentconsumption, and a power gating control system.

FIG. 1 illustrates the configuration of an electronic system 10 inaccordance with an embodiment.

Referring to FIG. 1, the electronic system 10 in accordance with apresent embodiment may include a memory 20 and a processor 30.

The electronic system 10 may have a system-on-chip (SoC) configuration.

The processor 30 may include a central processing unit (CPU) or graphicprocessing unit (GPU).

The processor 30 may include a processor core 31 and a memory controller32.

The processor core 31 may provide various commands CMD and addresses ADDfor controlling the memory 20 to the memory controller 32.

The memory controller 32 may control the memory 20 by providing firstand second supply voltages VDDH and VDDL, a chip select signal CS and acommand/address signal CA to the memory 20 according to a command CMDand address ADD provided from the processor core 31.

The memory controller 32 may transmit and receive data DQ to and fromthe memory 20.

The memory 20 may include a memory core 21, a data processing circuit 22and a control circuit 23.

The memory core 21 may include a plurality of unit memory regions, forexample, memory banks BK and circuit components for data input/output ofthe memory banks BK.

The data processing circuit 22 may perform a data input/output-relatedoperation between the memory core 21 and the memory controller 32.

The control circuit 23 may control a data read/write operation and powergating-related operation of the memory 20, according to the chip selectsignal CS and the command/address signal CA which are provided from thememory controller 32 of the processor 30.

FIG. 2 illustrates the configuration of the power gating control system100 in accordance with a present embodiment.

The power gating control system 100 in accordance with a presentembodiment may use dynamic voltage frequency scaling (DVFS) and zigzagpower gating in combination with each other.

The DVFS may indicate a method that selectively uses supply voltageshaving different levels depending on operation frequencies, in order toreduce current consumption.

The zigzag power gating may indicate a method for cutting off powersupply to a plurality of logic gates excluding logic gates whichrequires power at all times, in a power down mode.

Although described later, the power gating control system in accordancewith a present embodiment can couple voltage selector switches relatedto the DVFS and power gating switches related to the zigzag power gatingin parallel to each other, based on power rails, thereby preventing aperformance reduction which may occur when the voltage selector switchesand the power gating switches are coupled in series. As illustrated inFIG. 2, the power gating control system 100 in accordance with a presentembodiment may include a mode register 101, a command control circuit102, a voltage generation circuit 103, a power gating control circuit104 and logic circuit regions 106-1 to 106-n (BLK1 to BLKn).

The logic circuit regions 106-1 to 106-n may be coupled to a pluralityof power rails 105 in common.

The plurality of power rails 105 may include a first power rail 105-1for providing the first supply voltage VDDH and a second power rail105-2 for providing the second supply voltage VDDL.

The power gating control system in accordance with a present embodimentmay use the first supply voltage VDDH during a high-speed operation orunder a high-frequency operation condition, according to the DVFS. Onthe other hand, the power gating control system may use the secondsupply voltage VDDL having a lower level than the first supply voltageVDDH, in order to reduce current consumption during a low-speedoperation or under a low-frequency operation condition.

The logic circuit region 106-1 may selectively use the first and secondsupply voltages VDDH and VDDL according to the DVFS, and the supply ofthe first and second supply voltages VDDH and VDDL may be cut off in thepower down mode according to the zigzag power gating.

The logic circuit region 106-1 (BLK1) may include a plurality of logicgates which will be described later, and each of the logic gates may beconfigured to perform its own function.

The mode register 101 may output one or more code signals CODEi amongcode signals CODEi stored in advance, according to the command/addresssignal CA.

The mode register 101 may store bulk bias values as the code signals,for a voltage condition, i.e. each of the first and second supplyvoltages VDDH and VDDL, the bulk bias values being optimized forthreshold voltage control for each operation frequency/logic circuitregion through a test performed in advance.

The command control circuit 102 may determine an operation state(active/power down) of the electronic device and the frequency of aclock signal according to the command/address signal CA inputted fromoutside, and generate control signals CTRL according to the operationstate of the electronic device and the frequency of the clock signal.

The command control circuit 102 may transmit the command/address signalCA to the mode register 101, and generate a decoding signal DEC_CODE bydecoding a code signal CODEi outputted from the mode register 101.

The voltage generation circuit 103 may generate a plurality of bulk biasvoltages Vpbd and Vnbd according to the decoding signal DEC_CODE.

The power gating control circuit 104 may generate voltage select signalsSEL_VDD1, SEL_VDD2, ˜ and power down signals PDE1, PDE2, ˜ which aredistinguished for the respective logic circuit regions 106-1 to 106-n,according to the control signals CTRL provided from the command controlcircuit 102, and select and output bulk bias voltages Vpbd_H1, Vpbd_L1,Vnbd_1, Vpbd_H2, Vpbd_L2, Vnbd_2, ˜ which are suitable for therespective logic circuit regions 106-1 to 106-n, among the plurality ofbulk bias voltages Vpbd and Vnbd.

FIG. 3 illustrates the configuration of the mode register 101 of FIG. 2.

As illustrated in FIG. 3, the mode register 101 may be divided into aregister group related to the first supply voltage VDDH and a registergroup related to the second supply voltage VDDL, and the bulk biasvalues optimized for the respective operation frequencies/logic circuitregions through tests performed in advance may be stored as code valuesin the register groups.

At this time, the bulk bias values optimized for the respectiveoperation frequencies/logic circuit regions may be different from oneanother. Thus, the corresponding code values may also be different fromone another.

FIG. 4 illustrates the configuration of the logic circuit region 106-1of FIG. 2.

As illustrated in FIG. 4, the logic circuit region 106-1 may include afirst switching circuit 120-1 and 120-2, a second switching circuit 110,a logic gate group 150 and a local control circuit 170.

The first switching circuit 120-1 and 120-2 and the second switchingcircuit 110 may be coupled in parallel to the plurality of power rails105 (i.e., 105-1 and 105-2).

The first switching circuit 120-1 and 120-2 may cut off the power supplyto the logic gate group 150, according to the voltage select signalSEL_VDD1 and the power down signal PDE1, i.e. a power down-modehigh-voltage control signal PDE_VH1 and a power down-mode low-voltagecontrol signal PDE_VL1 which are generated according to the voltageselect signal SEL_VDD1 and the power down signal PDE1. The firstswitching circuit 120-1 and 120-2 may be cut off by opening the switches133, 131, 132, to prevent the power supplies from being received throughthe first switching circuit 120-1 and 120-2 by the logic gate group 150.

The first switching circuit 120-1 and 120-2 may include first to thirdswitches 131 to 133. The first switch 131 may be coupled to the firstpower rail 105-1 to which the first supply voltage VDDH is applied,between the plurality of power rails 105, the second switch 132 may becoupled to the second power rail 105-2 to which the second supplyvoltage VDDL is applied, and the third switch 133 may be coupled to aground voltage VSS terminal.

The first switch 131 may include a PMOS transistor having a sourcecoupled to the first power rail 105-1, a drain coupled to the logic gategroup 150, and a gate configured to receive the power down-modehigh-voltage control signal PDE_VH1.

The bulk bias voltage Vpbd_H1 may be applied to a bulk terminal of thefirst switch 131.

The second switch 132 may include a PMOS transistor having a sourcecoupled to the second power rail 105-2, a drain coupled to the logicgate group 150, and a gate configured to receive the power down-modelow-voltage control signal PDE_VL1.

The bulk bias voltage Vpbd_L1 may be applied to a bulk terminal of thesecond switch 132.

The third switch 133 may include an NMOS transistor having a sourcecoupled to the ground voltage VSS terminal, a drain coupled to the logicgate group 150, and a gate configured to receive the power down signalPDE1.

The bulk bias voltage Vnbd_1 may be applied to a bulk terminal of thethird switch 133.

The second switching circuit 110 may provide one of the first and secondsupply voltages VDDH and VDDL to the logic gate group 150 according tothe voltage select signal SEL_VDD1.

The second switching circuit 110 may include first and second switches111 and 112. The first switch 111 may be coupled to the first power rail105-1 to which the first supply voltage VDDH is applied, between theplurality of power rails 105, and the second switch 112 may be coupledto the second power rail 105-2 to which the second supply voltage VDDLis applied. The second switching circuit 110 may be cut off by openingthe switches 111 and 112, to prevent the power supplies from beingreceived through the second switching circuit 110 by the logic gategroup 150.

The first switch 111 may include a PMOS transistor having a sourcecoupled to the first power rail 105-1, a drain coupled to the logic gategroup 150, and a gate configured to receive the voltage select signalSEL_VDD1.

The second switch 112 may include a PMOS transistor having a sourcecoupled to the second power rail 105-2, a drain coupled to the logicgate group 150, and a gate configured to receive the inverted voltageselect signal SEL_VDD1.

The logic gate group 150 may include a plurality of logic gates 151 to154.

At this time, the plurality of logic gates 151 to 154 may be coupled tothe second switching circuit 110 and the first switching circuit 120-1and 120-2 through the zigzag power gating method.

That is, among the plurality of logic gates 151 to 154, the logic gates151 and 152 which require power at all times may be coupled to receivepower through the second switching circuit 110, and the other logicgates 153 and 154 may be coupled to receive power through the firstswitching circuit 120-1 and 120-2.

The local control circuit 170 may generate the power down-modehigh-voltage control signal PDE_VH1 and the power down-mode low-voltagecontrol signal PDE_VL1 according to the voltage select signal SEL_VDD1and the power down signal PDE1.

The local control circuit 170 may perform inversion and NAND operations.For example, the local control circuit 170 may include an inverter 171,a first NAND gate 172 and a second NAND gate 173.

The inverter 171 may invert the voltage select signal SEL_VDD1, andoutput the inverted voltage select signal SEL_VDD1.

The first NAND gate 172 may perform a NAND operation on the outputsignal of the inverter 171 and the power down signal PDE1, and outputthe operation result as the power down-mode high-voltage control signalPDE_VH1.

The second NAND gate 173 may perform a NAND operation on the voltageselect signal SEL_VDD1 and the power down signal PDE1, and output theoperation result as the power down-mode low-voltage control signalPDE_VL1.

Hereafter, the operation of the power gating control system inaccordance with a present embodiment will be described.

At this time, since the logic circuit regions 106-1 to 106-n can becontrolled in a similar manner, the following descriptions will befocused on the logic circuit region 106-1.

The command control circuit 102 may decode the command/address signal CAto determine an operation state (active/power down) of the electronicdevice and the frequency of the clock signal, and generate the controlsignals CTRL according to the operation state and the frequency.

The command control circuit 102 may transmit the command/address signalCA to the mode register 101, and generate the decoding signal DEC_CODEby decoding the code signal CODEi outputted from the mode register 101.

For example, suppose that the command/address signal CA defines theactive state of the electronic device (for example, data read/write orthe like), and the frequency of the clock signal defines a highfrequency according to an internally decided reference value.

As described above, the power gating control system in accordance with apresent embodiment may use the first supply voltage VDDH during ahigh-speed operation or under a high-frequency operation condition,according to the DVFS. Under a low-frequency operation condition,however, the power gating control system may use the second supplyvoltage VDDL having a lower level than the first supply voltage VDDH, inorder to reduce current consumption.

Therefore, according to the control signals CTRL provided from thecommand control circuit 102, the power gating control circuit 104 mayoutput the voltage select signal SEL_VDD1 at a low level and output thepower down signal PDE1 at an inactive level, for example, a high level,in order to select the first supply voltage VDDH.

The power gating control circuit 104 may select and output the bulk biasvoltages Vpbd_H1, Vpbd_L1 and Vnbd_1 corresponding to the activestate/high frequency condition, among the plurality of bulk biasvoltages Vpbd and Vnbd, according to the control signals CTRL providedfrom the command control circuit 102.

Since the voltage select signal SEL_VDD1 is at a low level, the secondswitching circuit 110 may provide the first supply voltage VDDH to thelogic circuit region 106-1.

Furthermore, since the voltage select signal SEL_VDD1 is at a low leveland the power down signal PDE1 is at a high level, the local controlcircuit 170 may output the power down-mode high-voltage control signalPDE_VH1 at a low level, and output the power down-mode low-voltagecontrol signal PDE_VL1 at a high level.

Since the power down-mode high-voltage control signal PDE_VH1 is at alow level and the power down-mode low-voltage control signal PDE_VL1 isat a high level, the first switching circuit 120-1 and 120-2 may providethe first supply voltage VDDH to the logic circuit region 106-1.

The logic circuit region 106-1 may perform its own functions accordingto the first supply voltage VDDH.

Furthermore, suppose that the command signal CMD defines the activestate of the electronic device, and the frequency of the clock signaldefines a low frequency according to the internally decided referencevalue.

According to the control signals CTRL provided from the command controlcircuit 102, the power gating control circuit 104 may output the voltageselect signal SEL_VDD1 at a high level and output the power down signalPDE1 at a high level, in order to select the second supply voltage VDDL.

Furthermore, the power gating control circuit 104 may select and outputthe bulk bias voltages Vpbd_H1, Vpbd_L1 and Vnbd_1 corresponding to theactive state/low frequency condition, among the plurality of bulk biasvoltages Vpbd and Vnbd, according to the control signals CTRL providedfrom the command control circuit 102.

Since the voltage select signal SEL_VDD1 is at a high level, the secondswitching circuit 110 may provide the second supply voltage VDDL to thelogic circuit region 106-1.

Furthermore, since the voltage select signal SEL_VDD1 is at a high leveland the power down signal PDE1 is at a high level, the local controlcircuit 170 may output the power down-mode high-voltage control signalPDE_VH1 at a high level, and output the power down-mode low-voltagecontrol signal PDE_VL1 at a low level.

Since the power down-mode high-voltage control signal PDE_VH1 is at ahigh level and the power down-mode low-voltage control signal PDE_VL1 isat a low level, the first switching circuit 120-1 and 120-2 may providethe second supply voltage VDDL to the logic circuit region 106-1.

The logic circuit region 106-1 may perform its own functions accordingto the second supply voltage VDDL.

Since the logic circuit region 106-1 operates according to the secondsupply voltage VDDL having a lower level than the first supply voltageVDDH, the current consumption can be reduced.

Furthermore, suppose that the command/address signal CA defines thepower-down state of the electronic device, and the frequency of theclock signal defines a low frequency according to the internally decidedreference value.

According to the control signals CTRL provided from the command controlcircuit 102, the power gating control circuit 104 may output the voltageselect signal SEL_VDD1 at a high level and output the power down signalPDE1 at an active level, i.e. a low level, in order to select the secondsupply voltage VDDL.

Furthermore, the power gating control circuit 104 may select and outputthe bulk bias voltages Vpbd_H1, Vpbd_L1 and Vnbd_1 corresponding to thepower-down state/low frequency condition, among the plurality of bulkbias voltages Vpbd and Vnbd, according to the control signals CTRLprovided from the command control circuit 102.

Since the voltage select signal SEL_VDD1 is at a high level, the secondswitching circuit 110 may provide the second supply voltage VDDL to thelogic circuit region 106-1.

Since the power down signal PDE1 is at a low level, the local controlcircuit 170 may output both of the power down-mode high-voltage controlsignal PDE_VH1 and the power down-mode low-voltage control signalPDE_VL1 at a high level, regardless of the level of the voltage selectsignal SEL_VDD1.

Since both of the power down-mode high-voltage control signal PDE_VH1and the power down-mode low-voltage control signal PDE_VL1 are at a highlevel, the first switching circuit 120-1 and 120-2 can cut off the powersupply to the logic circuit region 106-1.

Among the logic gates 151 to 154 of the logic circuit region 106-1, onlythe logic gates 151 and 152 to which the second supply voltage VDDL issupplied can perform their own functions according to the second supplyvoltage VDDL.

The threshold voltages of the transistors of the second switchingcircuit 110 and the first switching circuit 120-1 and 120-2 may becontrolled by the bulk bias voltages Vpbd_H1, Vpbd_L1 and Vnbd_1optimized for the power down state/low frequency condition, which makesit possible to minimize a leakage current.

Therefore, the power gating control system in accordance with a presentembodiment can use the second supply voltage VDDL having a low levelthrough the DVFS operation under the power down mode/low frequencycondition, thereby primarily reducing the current consumption of thelogic circuit regions 106-1 to 106-n. Furthermore, the power gatingcontrol system can cut off the power supply in the power down statethrough the power gating operation, thereby reducing the currentconsumption of the logic circuit regions 106-1 to 106-n.

Furthermore, the power gating control system can minimize a leakagecurrent in the power down state through the bulk bias voltage control,thereby further reducing the current consumption.

FIG. 5 illustrates the configuration of a power gating control system200 in accordance with other embodiments.

The power gating control system 200 in accordance with a presentembodiment may be applied to a header only power gating method.

The header only power gating method may indicate a power managementmethod that controls only the supply of a supply voltage between thesupply voltage and a ground voltage which are applied to logic circuitsof an electronic system, according to an operation speed (frequency) anda power down mode, and does not control the supply of the groundvoltage.

As illustrated in FIG. 5, the power gating control system 200 inaccordance with a present embodiment may include a command decoder 201,a mode register 202, a power down control circuit 203, a bulk biascontrol circuit 204 and logic circuit regions 206, 206-1 to 206-n (BLK1to BLKn).

The logic circuit regions 206-1 to 206-n may be coupled to a pluralityof power rails 205 in common.

The plurality of power rails 205 may include a first power rail 205-1for providing a first supply voltage VDDH and a second power rail 205-2for providing a second supply voltage VDDL.

The logic circuit region 206-1 (BLK1) may include a plurality of logicgates which will be described later, and each of the logic gates may beconfigured to perform its own functions.

The command decoder 201 may generate an internal operation command CMDby decoding a chip select signal CS and a command/address signal CA.

The internal operation command CMD may include a read command, writecommand, mode register read/write command and the like.

The mode register 202 may generate a voltage select signal SEL_VDDaccording to the command/address signal CA and the internal operationcommand CMD.

When the memory 20 is set to a high-speed operation mode, the moderegister 202 may generate the voltage select signal SEL_VDD at a lowlevel according to the command/address signal CA and the internaloperation command CMD which have a value corresponding to the high-speedoperation mode.

When the memory 20 is set to a low speed operation mode, the moderegister 202 may generate the voltage select signal SEL_VDD at a highlevel according to the command/address signal CA and the internaloperation command CMD which have a value corresponding to the low speedoperation mode.

The power down control circuit 203 may control the memory 20 to enterthe power down mode by activating the power down signal PDE to a lowlevel according to the internal operation command CMD and the chipselect signal CS.

When a transition of the chip select signal CS occurs in the power downmode, the power down control circuit 203 may deactivate the power downsignal PDE to a high level, such that the memory 20 escapes from thepower down mode or enters a normal mode.

The power gating control system 200 in accordance with a presentembodiment may include a second switching circuit, i.e. the bulk biascontrol circuit 204 for minimizing a leakage current by controlling thevoltage levels of the bulk terminals of logic gates in a logic gategroup 210.

The bulk bias control circuit 204 may provide any one of the first andsecond supply voltages VDDH and VDDL as a bulk bias BIAS_BULK to thebulk terminals of the logic gates 211 and 212 (see FIG. 6) of the logicgate group 210 according to the voltage select signal SEL_VDD,regardless of the power down signal PDE.

FIG. 6 illustrates the configuration of the logic circuit region 206-nand the bulk bias control circuit 204 in FIG. 5.

As illustrated in FIG. 6, the logic circuit region 206-n may include aswitching circuit 250, a switching control circuit 260 and the logicgate group 210.

The switching circuit 250 may include first and second switches 251 and252. The first switch 251 may be coupled to a first power rail 205-1 towhich the first supply voltage VDDH is applied, between the plurality ofpower rails 205-1 and 205-1, and the second switch 112 may be coupled toa second power rail 205-2 to which the second supply voltage VDDL isapplied.

The first switch 251 may include a PMOS transistor having a sourcecoupled to the first power rail 205-1 and a drain coupled to the logicgate group 210.

The second switch 252 may include a PMOS transistor having a sourcecoupled to the second power rail 205-2 and a drain coupled to the logicgate group 210.

The switching control circuit 260 may control the switching circuit 250according to the voltage select signal SEL_VDD and the power down signalPDE, such that any one of the first and second supply voltages VDDH andVDDL is provided to the logic gate group 210 or the first and secondsupply voltages VDDH and VDDL are blocked from being supplied to thelogic gate group 210.

The switching control circuit 260 may perform an inversion operation anda NAND operation. For example, the switching control circuit 260 mayinclude an inverter 261, a first NAND gate 262 and a second NAND gate263.

The inverter 261 may invert the voltage select signal SEL_VDD, andoutput the inverted signal.

The first NAND gate 262 may perform a NAND operation on the outputsignal of the inverter 261 and the power down signal PDE1, and outputthe operation result to the first switch 251.

The second NAND gate 263 may perform a NAND operation on the voltageselect signal SEL_VDD and the power down signal PDE, and output theoperation result to the gate of the second switch 252.

The bulk bias control circuit 204 may include an inverter 241 and firstand second switches 242 and 243. The first switch 242 may be coupled tothe first power rail 205-1 to which the first supply voltage VDDH isapplied, between the plurality of power rails 205-1 and 205-1, and thesecond switch 243 may be coupled to the second power rail 205-2 to whichthe second supply voltage VDDL is applied.

The first switch 242 may include a PMOS transistor having a sourcecoupled to the first power rail 205-1 and a drain configured to output abulk bias BIAS_BULK.

The second switch 243 may include a PMOS transistor having a sourcecoupled to the second power rail 205-2 and a drain configured to outputthe bulk bias BIAS_BULK.

The logic gate group 210 may include a plurality of logic gates 211 and212.

The logic gate group 210 may indirectly receive the first or secondsupply voltage VDDH or VDDL through the switching circuit 250, and theheader only power gating method in which the logic gates are directlycoupled to the ground voltage VSS line may be applied to the logic gategroup 210. The bulk bias BIAS_BULK provided from the bulk bias controlcircuit 204 may be inputted to the bulk terminals of the plurality oflogic gates 211 and 212 in the logic gate group 210.

Hereafter, the operation of the power gating control system of FIGS. 5and 6 in accordance with a present embodiment will be described.

At this time, since the logic circuit regions 206-1 to 206-n can becontrolled in a similar manner, the following descriptions will befocused on the logic circuit region 206-n.

The command decoder 201 may decode the chip select signal CS and thecommand/address signal CA to determine the operation state (active/powerdown) of the electronic device and the frequency of the clock signal,and generate the control signals CTRL according to the operation stateof the electronic device and the frequency of the clock signal.

For example, suppose that the command/address signal CA defines anactive state of the electronic device (for example, data read/write orthe like), and the frequency of the clock signal defines a highfrequency according to an internally decided reference value.

As described above, the power gating control system in accordance with apresent embodiment may use the first supply voltage VDDH during ahigh-speed operation or under a high-frequency operation condition.Under a low-frequency operation condition, however, the power gatingcontrol system may use the second supply voltage VDDL having a lowerlevel than the first supply voltage VDDH, in order to reduce currentconsumption.

According to the internal command signal CMD and the command/addresssignal CA which are provided from the command decoder 201, the moderegister 202 may output the voltage select signal SEL_VDD at a lowlevel, in order to select the first supply voltage VDDH.

Since the electronic device is activated, the power down control circuit203 may output the power down signal PDE at an inactive level, forexample, a high level.

Since the voltage select signal SEL_VDD is at a low level and the powerdown signal PDE is at a high level, the first supply voltage VDDH may beprovided to the logic circuit region 206-n.

The logic circuit region 206-n may perform its own functions accordingto the first supply voltage VDDH.

Since the voltage select signal SEL_VDD is at a low level, the bulk biascontrol circuit 204 may provide the first supply voltage VDDH to thebulk terminals of the logic gates 211 and 212 in the logic circuitregion 206-n.

Furthermore, suppose that the command signal CMD defines the activestate of the electronic device, and the frequency of the clock signaldefines a low frequency according to the internally decided referencevalue.

According to the internal command signal CMD and the command/addresssignal CA which are provided from the command decoder 201, the moderegister 202 may output the voltage select signal SEL_VDD at a highlevel, in order to select the second supply voltage VDDL.

Since the electronic device is activated, the power down control circuit203 may output the power down signal PDE at an inactive level, forexample, a high level.

Since the voltage select signal SEL_VDD is at a high level and the powerdown signal PDE is at a high level, the second supply voltage VDDL maybe provided to the logic circuit region 206-n.

The logic circuit region 206-n may perform its own functions accordingto the second supply voltage VDDL.

Since the voltage select signal SEL_VDD is at a high level, the bulkbias control circuit 204 may provide the second supply voltage VDDL tothe bulk terminals of the logic gates 211 and 212 in the logic circuitregion 206-n.

Furthermore, suppose that the command/address signal CA defines thepower down state of the electronic device.

When the electronic device enters the power down state, the moderegister 202 may retain the voltage select signal SEL_VDD in the finalstate, according to the internal command signal CMD and thecommand/address signal CA which are provided from the command decoder201. For example, suppose that the voltage select signal SEL_VDD was ata high level before the electronic device enters the power down state.

Since the electronic device is in the power down state, the power downcontrol circuit 203 may output the power down signal PDE at an activelevel, i.e. a low level.

Since the power down signal PDE is at a low level, the power supply tothe logic circuit region 206-n may be cut off, regardless of the levelof the voltage supply signal SEL_VDD. That is, none of the first andsecond supply voltages VDDH and VDDL may be provided to the logiccircuit region 206-n.

Since the voltage select signal SEL_VDD is retained at a high level, thebulk bias control circuit 204 may provide the second supply voltage VDDLto the bulk terminals of the logic gates 211 and 212 of the logiccircuit region 206-n, regardless of the power down signal PDE, therebyminimizing an occurrence of leakage current in the power down state.

When the electronic device is in the power down state, the power supplyto all of the logic circuit regions 206-1 to 206-n may be cut off. Atthis time, when the bulk bias control circuit 204 is not present, thebulk terminals of the logic gates in the logic circuit regions 206-1 to206-n may float, and a leakage current may be caused by the floating ofthe bulk terminals. In this case, the power gating performance may bedegraded.

In a present embodiment, the header only power gating method can beapplied to reduce the circuit area for power gating as well as thecurrent consumption. Even when the electronic device is in the powerdown state, the power gating control system can provide a voltagesuitable for the operating condition (high speed/low speed) of theelectronic device as a bias through the bulk bias control circuit 204,thereby further increasing the current consumption reduction effect.

While various embodiments have been described above, it will beunderstood to those skilled in the art that the embodiments describedare examples only. Accordingly, the power gating circuit describedherein should not be limited based on the described embodiments.

What is claimed is:
 1. A power gating circuit comprising: a power gatingcontrol circuit configured to generate a power down signal and a voltageselection signal; a logic gate group; a first switching circuitconfigured to receive the power down signal and the voltage selectionsignal, provide a first supply voltage to the logic gate group when thepower down signal and the voltage select signal have a firstcombination, provide a second supply voltage to the logic gate groupwhen the power down signal and the voltage select signal have a secondcombination and cut off the supply of the first and second supplyvoltages to the logic gate group according to the power down signal; anda second switching circuit configured to receive the voltage selectionsignal, provide the second supply voltage to the logic gate group whenthe voltage select signal is at a first level and provide the firstsupply voltage to the logic gate group when the voltage select signal isat a second level, wherein the first and second switching circuits arecoupled in parallel to a plurality of power rails for providing thefirst and second supply voltages.
 2. The power gating circuit accordingto claim 1, further comprising a local control circuit configured forthe first switching circuit to provide the first supply voltage to thelogic gate group when the power down signal is at a first level and thevoltage select signal is at a second level, provide the second supplyvoltage to the logic gate group when the power down signal is at thefirst level and the voltage select signal is at the first level and cutoff the supply of the first and second supply voltages to the logic gategroup when the power down signal is at the second level and configuredfor the second switching circuit to provide the first supply voltage tothe logic gate group when the voltage select signal is at the secondlevel and provide the second supply voltage to the logic gate group whenthe voltage select signal is at the first level.
 3. The power gatingcircuit according to claim 1, wherein the first switching circuitcomprises a plurality of transistors, and the plurality of transistorshave a threshold voltage that is varied according to an operation stateof an electronic device to which the power gating circuit is applied. 4.The power gating circuit according to claim 1, wherein the firstswitching circuit comprises: a first switch coupled to the logic gategroup and a first power rail to which the first supply voltage isapplied, among the plurality of power rails; a second switch coupled tothe logic gate group and a second power rail to which the second supplyvoltage is applied; and a third switch coupled to a ground terminal andthe logic gate group.
 5. The power gating circuit according to claim 1,wherein the first switching circuit is coupled to parts of the logicgate group, and the second switching circuit is coupled to other partsof the logic gate group different from the parts of the logic gategroup.
 6. The power gating circuit according to claim 1, wherein thesecond switching circuit comprises: a first switch coupled to a firstpower rail to which the first supply voltage is applied, among theplurality of power rails; and a second switch coupled to a second powerrail to which the second supply voltage is applied.
 7. A power gatingcontrol system comprising: a logic circuit region configured to receivea power down signal and a voltage select signal, be input a first supplyvoltage when the power down signal is at a first level and the voltageselect signal is at a second level, be input a second supply voltagewhen the power down signal is at the first level and the voltage selectsignal is at the first level and comprising logic gates of whichthreshold voltages are varied according to bulk bias voltages; a moderegister configured to store bulk bias voltages as code signals for thefirst and second supply voltages, respectively, the bulk bias voltagesbeing optimized for threshold voltage control at operation frequencies;a command control circuit configured to determine an operation state ofan electronic device and a frequency of a clock signal according to acommand signal inputted from outside, and generate control signalsaccording to the operation state and the frequency; a voltage generationcircuit configured to generate a plurality of bulk bias voltagesaccording to the code signals; and a power gating control circuitconfigured to receive the control signals, generate the power downsignal and the voltage select signal according to the control signals,select the bulk bias voltages suitable for the logic circuit regionamong the plurality of bulk bias voltages according to the controlsignals, and provide the selected bulk bias voltages to the logiccircuit region.
 8. The power gating control system according to claim 7,wherein the logic circuit region comprises: a logic gate group; a firstswitching circuit configured to provide the first supply voltage to thelogic gate group when the power down signal is at the first level andthe voltage select signal is at the second level, provide the secondsupply voltage to the logic gate group when the power down signal is atthe first level and the voltage select signal is at the first level andcut off the supply of the first and second supply voltages to the logicgate group when the power down signal is at the second level; and asecond switching circuit configured to provide the first supply voltageto the logic gate group when the voltage select signal is at the secondlevel and provide the second supply voltage to the logic gate group whenthe voltage select signal is at the first level, wherein the first andsecond switching circuits are coupled in parallel to a plurality ofpower rails for providing the first and second supply voltages.
 9. Thepower gating control system according to claim 8, further comprising alocal control circuit configured to control the first switching circuitthrough a combination of the power down signal and the voltage selectsignal.
 10. The power gating control system according to claim 8,wherein the first switching circuit comprises a plurality oftransistors, and the plurality of transistors have a threshold voltagethat is varied according to an operation state of an electronic deviceto which the power gating circuit is applied.
 11. The power gatingcontrol system according to claim 8, wherein the first switching circuitcomprises: a first switch coupled to the logic gate group and a firstpower rail to which the first supply voltage is applied, among theplurality of power rails; a second switch coupled to the logic gategroup and a second power rail to which the second supply voltage isapplied; and a third switch coupled to a ground terminal and the logicgate group.
 12. The power gating control system according to claim 8,wherein the first switching circuit is coupled to parts of the logicgate group, and the second switching circuit is coupled other parts ofthe logic gate group different from the parts of the logic gate group.13. The power gating control system according to claim 8, wherein thesecond switching circuit comprises: a first switch coupled to a firstpower rail to which the first supply voltage is applied, among theplurality of power rails; and a second switch coupled to a second powerrail to which the second supply voltage is applied.
 14. A power gatingcircuit comprising: a mode register configured to generate a voltageselect signal; a power down control circuit configured to generate apower down signal; a logic gate group; a switching circuit configured toreceive the voltage select signal and the power down signal, provide afirst supply voltage to the logic gate group when the power down signaland the voltage select signal have a first combination, provide a secondsupply voltage to the logic gate group when the power down signal andthe voltage select signal have a second combination and cut off thesupply of the first and second supply voltages to the logic gate groupaccording to the power down signal; and a bulk bias control circuitconfigured to receive the voltage select signal, provide the firstsupply voltage as a bulk bias of the logic gate group when the voltageselect signal is at the second level and provide the second supplyvoltage as the bulk bias of the logic gate group when the voltage selectsignal is at the first level, wherein the switching circuit and the bulkbias control circuit are coupled in parallel to a plurality of powerrails for providing the first and second supply voltages.
 15. The powergating circuit according to claim 14, further comprising a switchingcontrol circuit configured for the switching circuit to provide thefirst supply voltage to the logic gate group when the power down signalis at a first level and the voltage select signal is at a second level,provide the second supply voltage to the logic gate group when the powerdown signal is at the first level and the voltage select signal is atthe first level and cut off the supply of the first and second supplyvoltages to the logic gate group when the power down signal is at thesecond level.
 16. The power gating circuit according to claim 14,wherein the switching circuit comprises: a first switch coupled to afirst power rail to which the first supply voltage is applied, among theplurality of power rails; and a second switch coupled to a second powerrail to which the second supply voltage is applied.
 17. The power gatingcircuit according to claim 14, wherein the bulk bias control circuit iscoupled to bulk terminals of logic gates of the logic gate group incommon.